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Author/Creator Jeannot, Simon

1. A Fabrication Process for Emerging Nanoelectronic Devices Based on Oxide Tunnel Junctions. (23rd February 2017)

Authors:
Drouin, Dominique; Droulers, Gabriel; Labalette, Marina; Lee Sang, Bruno; Harvey-Collard, Patrick; Souifi, Abdelkader; Jeannot, Simon; Monfray, Stephane; Pioro-Ladriere, Michel; Ecoffey, Serge
Other Names:
Ji Li Academic Editor.
Journal:
Journal of nanomaterials
Issue:
Volume 2017(2017)
Page Start:
Record Type:
Journal Article
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Available online (eLD content is only available in our Reading Rooms) ↗

2. Development and application of the Oxide Stress Separation technique for the measurement of ONO leakage currents at low electric fields in 40 nm floating gate embedded-flash memory. (February 2017)

Authors:
Dobri, Adam; Jeannot, Simon; Piazza, Fausto; Jahan, Carine; Coignus, Jean; Perniola, Luca; Balestra, Francis
Journal:
Microelectronics and reliability
Issue:
Volume 69(2017)
Page Start:
47
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗

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