1. Characterization of 3.2 Gbps readout in 65 nm CMOS technology. (1st January 2023) Authors: Jirsa, J.; Gecnuk, J.; Havranek, M.; Janoska, Z.; Jansky, M.; Kafka, V.; Korchak, O.; Kostina, A.; Lednicky, D.; Marcisovska, M.; Marcisovsky, M.; Stanek, P.; Tomasek, L.; Vancura, P. Journal: Journal of instrumentation Issue: Volume 18:Number 1(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗