1. Development of accurate dose evaluation technique of X-ray inspection for quality assurance of semiconductor with Monte Carlo simulation. (December 2019) Authors: Park, Hyojun; Choi, Hyun Joon; Rhew, Keunho; Lim, Heonsang; Lee, Hyunyoung; Jang, Iloh; Min, Chul Hee Journal: Applied radiation and isotopes Issue: Volume 154(2019:Dec.) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗