1. Optimisation of sample preparation and analysis conditions for atom probe tomography characterisation of low concentration surface species. (21st July 2016) Authors: Douglas, J O; Bagot, P A J; Johnson, B C; Jamieson, D N; Moody, M P Journal: Semiconductor science and technology Issue: Volume 31:Number 8(2016:Aug.) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Quantifying the quantum gate fidelity of single-atom spin qubits in silicon by randomized benchmarking. (18th March 2015) Authors: Muhonen, J T; Laucht, A; Simmons, S; Dehollain, J P; Kalra, R; Hudson, F E; Freer, S; Itoh, K M; Jamieson, D N; McCallum, J C; Dzurak, A S; Morello, A Journal: Journal of physics Issue: Volume 27:Number 15(2015) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Single atom devices by ion implantation. (18th March 2015) Authors: van Donkelaar, Jessica; Yang, C; Alves, A D C; McCallum, J C; Hougaard, C; Johnson, B C; Hudson, F E; Dzurak, A S; Morello, A; Spemann, D; Jamieson, D N Journal: Journal of physics Issue: Volume 27:Number 15(2015) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗