1. Determination of relative sensitivity factor, sputtering rate, and detection limits of deuterium in deuterium ion‐implanted Zircaloy‐4 using secondary ion mass spectrometer. (8th August 2022) Authors: Singh, Manish; Karki, Vijay; Jaison, Perumpillil G. Journal: Surface and interface analysis Issue: Volume 54:Number 11(2022) Page Start: 1163 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗