1. 30 kV STEM-SEM – The Perfect Conditions for Transmission Spectroscopy?. (August 2021) Authors: Marks, Sam; Pinard, Philippe; Jabar, Sharhid; West, Geoff; Wetzel, George; Burgess, Simon; Lang, Christian Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 1324 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. High Resolution Low kV SEM EDS – Breaking Convention with Low Working Distance EDS. (August 2020) Authors: Marks, Samuel; Jabar, Sharhid; West, Geoff; Burgess, Simon Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 2170 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗