Author/Creator: Iwazaki, Yoshitaka - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Iwazaki, Yoshitaka

1. Characteristic Change of GeO2/Ge Interface by Hf-Post Metallization Annealing. (9th April 2018)

Authors:: Fujiwara, Haruka; Iwazaki, Yoshitaka; Ueno, Tomo
Journal:: ECS transactions
Issue:: Volume 85:Number 6(2018)
Page Start:: 43
Record Type:: Journal Article
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2. Investigation of High Current Tetracene-TFT Using Surface Nitrided SiO2 Gate Insulator Film. (18th August 2016)

Authors:: Nakao, Hiroki; Hori, Kabuto; Iwazaki, Yoshitaka; Ueno, Tomo
Journal:: ECS transactions
Issue:: Volume 75:Number 10(2016)
Page Start:: 81
Record Type:: Journal Article
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3. The Improvement of GeO2 Film Characteristics on Ge Substrates Using Ultrathin Hf Metal Deposition Followed by Annealing. (18th August 2016)

Authors:: Ueno, Tomo; Niida, Jun-pei; Yamaguchi, Marina; Iwazaki, Yoshitaka
Journal:: ECS transactions
Issue:: Volume 75:Number 8(2016)
Page Start:: 675
Record Type:: Journal Article
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