1. Targeted defect analysis in VCSEL oxide windows using 3D slice and view. (11th May 2021) Authors: Sun, X; Rickard, W D A; Ironside, C N; Kostakis, I; Missous, M; Powell, D; Anjomshoaa, A; Meredith, W Journal: Semiconductor science and technology Issue: Volume 36:Number 6(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗