Author/Creator: Ioannou-Sougleridis, V. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Ioannou-Sougleridis, V.

1. Phosphorous Diffusion in N2+-Implanted Germanium during Flash Lamp Annealing: Influence of Nitrogen on Ge Substrate Damage and Capping Layer Engineering. (1st January 2017)

Authors:: Skarlatos, D.; Ioannou-Sougleridis, V.; Barozzi, M.; Pepponi, G.; Velessiotis, D.; Skoulikidou, M. C.; Vouroutzis, N. Z.; Papagelis, K.; Dimitrakis, P.; Thomidis, C.; Colombeau, B.
Journal:: ECS journal of solid state science and technology
Issue:: Volume 6:Number 7(2017)
Page Start:: P418
Record Type:: Journal Article
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2. Phosphorous Diffusion in N2+-Implanted Germanium during Flash Lamp Annealing: Influence of Nitrogen on Ge Substrate Damage and Capping Layer Engineering. (25th May 2017)

Authors:: Skarlatos, D.; Ioannou-Sougleridis, V.; Barozzi, M.; Pepponi, G.; Velessiotis, D.; Skoulikidou, M. C.; Vouroutzis, N. Z.; Papagelis, K.; Dimitrakis, P.; Thomidis, C.; Colombeau, B.
Journal:: ECS journal of solid state science and technology
Issue:: Volume 6:Number 7(2017)
Page Start:: P418
Record Type:: Journal Article
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3. Post-metallization annealing and photolithography effects in p-type Ge/Al2O3/Al MOS structures. (1st April 2022)

Authors:: Ioannou-Sougleridis, V.; Alafakis, S.; Pécz, B.; Velessiotis, D.; Vouroutzis, N. Z.; Ladas, S.; Barozzi, M.; Pepponi, G.; Skarlatos, D.
Journal:: ECS journal of solid state science and technology
Issue:: Volume 11:Number 4(2022)
Page Start:
Record Type:: Journal Article
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4. Strong Diffusion Suppression of Low Energy–Implanted Phosphorous in Germanium by N2 Co-Implantation. (1st January 2015)

Authors:: Thomidis, C.; Barozzi, M.; Bersani, M.; Ioannou-Sougleridis, V.; Vouroutzis, N. Z.; Colombeau, B.; Skarlatos, D.
Journal:: ECS Solid State Letters
Issue:: Volume 4:Number 6(2015)
Page Start:: P47
Record Type:: Journal Article
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5. Strong Diffusion Suppression of Low Energy–Implanted Phosphorous in Germanium by N2 Co-Implantation. (21st April 2015)

Authors:: Thomidis, C.; Barozzi, M.; Bersani, M.; Ioannou-Sougleridis, V.; Vouroutzis, N. Z.; Colombeau, B.; Skarlatos, D.
Journal:: ECS Solid State Letters
Issue:: Volume 4:Number 6(2015)
Page Start:: P47
Record Type:: Journal Article
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6. Substrate damage in ion-implanted (100) germanium after extended ms flash lamp annealing: Origins and suppression. (February 2021)

Authors:: Skarlatos, D.; Velessiotis, D.; Skoulikidou, M.C.; Ioannou-Sougleridis, V.; Vouroutzis, N.Z.; Stoemenos, J.
Journal:: Materials science in semiconductor processing
Issue:: Volume 122(2021)
Page Start:
Record Type:: Journal Article
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