1. Structural, syntactic, and statistical pattern recognition : joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29-December 2, 2016, Proceedings /: joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29-December 2, 2016, Proceedings. (2016) Editors: Robles-Kelly, Antonio A; Loog, Marco; Biggio, Battista; Escolano, Francisco; Wilson, Richard Other Names: International Workshop on Structural and Syntactic Pattern Recognition; International Workshop on Statistical Techniques in Pattern Recognition Record Type: Book Extent: 1 online resource (xiii, 588 pages), illustrations View Content: Available online (eLD content is only available in our Reading Rooms) ↗