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Author/Creator Inal, Karim

1. Electromigration-induced failure in operando characterization of 3D interconnects: microstructure influence. Issue 8 (July 2015)

Authors:
Gousseau, Simon; Moreau, Stéphane; Bouchu, David; Farcy, Alexis; Montmitonnet, Pierre; Inal, Karim; Bay, François; Zelsmann, Marc; Picard, Emmanuel; Salaun, Mathieu
Journal:
Microelectronics and reliability
Issue:
Volume 55:Issue 8(2015)
Page Start:
1205
Record Type:
Journal Article
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