1. Comparison of Single-Particle Monte Carlo Simulation with Measured Output Characteristics of an 0.1µm n-MOSFET. Issue 4 (2002) Authors: Bufler, F. M.; Schenk, A.; Zechner, C.; Inada, N.; Asahi, Y.; Fichtner, W. Journal: VLSI design Issue: Volume 15:Issue 4(2002) Page Start: 715 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗