Author/Creator: Ikuno, Hajime - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Ikuno, Hajime

1. A newly developed rapid uniform thermal cycle test system for electronic components. (November 2017)

Authors:: Ikuno, Hajime
Journal:: Microelectronics and reliability
Issue:: Volume 78(2017)
Page Start:: 53
Record Type:: Journal Article
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