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Author/Creator Ihlefeld, Jon F.

11. Metal Nitride Electrode Stress and Chemistry Effects on Phase and Polarization Response in Ferroelectric Hf0.5Zr0.5O2 Thin Films. Issue 10 (23rd March 2021)

Authors:
Fields, Shelby S.; Smith, Sean W.; Fancher, Chris M.; Henry, Michael David; Wolfley, Steve L.; Sales, Maria G.; Jaszewski, Samantha T.; Rodriguez, Mark A.; Esteves, Giovanni; Davids, Paul S.; McDonnell, Stephen J.; Ihlefeld, Jon F.
Journal:
Advanced materials interfaces
Issue:
Volume 8:Issue 10(2021)
Page Start:
n/a
Record Type:
Journal Article
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12. Origin of Ferroelectric Phase Stabilization via the Clamping Effect in Ferroelectric Hafnium Zirconium Oxide Thin Films. (3rd August 2022)

Authors:
Fields, Shelby S.; Cai, Truong; Jaszewski, Samantha T.; Salanova, Alejandro; Mimura, Takanori; Heinrich, Helge H.; Henry, Michael David; Kelley, Kyle P.; Sheldon, Brian W.; Ihlefeld, Jon F.
Journal:
Advanced Electronic Materials
Issue:
Volume 8:Number 12(2022)
Page Start:
n/a
Record Type:
Journal Article
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13. Phase and Texture Evolution in Chemically Derived PZT Thin Films on Pt Substrates. Issue 9 (7th June 2014)

Authors:
Mhin, Sungwook; Nittala, Krishna; Lee, Jinhyung; Robinson, Douglas S.; Ihlefeld, Jon F.; Brennecka, Geoff L.; Sanchez, Luz M.; Polcawich, Ronald G.; Jones, Jacob L.; Alford, N.
Journal:
Journal of the American Ceramic Society
Issue:
Volume 97:Issue 9(2014)
Page Start:
2973
Record Type:
Journal Article
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Available online (eLD content is only available in our Reading Rooms) ↗