1. Application of Fast Laser Deprocessing Techniques on large cross-sectional view area sample with FIB-SEM dual beam system. (September 2016) Authors: Zhao, Y.Z.; Wang, Q.J.; Tan, P.K.; Yap, H.H.; Liu, B.H.; Feng, H.; Tan, H.; He, R.; Huang, Y.M.; Wang, D.D.; Zhu, L.; Chen, C.Q.; Rivai, F.; Lam, J.; Mai, Z.H. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 362 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Application of Fast Laser Deprocessing Techniques on large cross-sectional view area sample with FIB-SEM dual beam system. (September 2016) Authors: Zhao, Y.Z.; Wang, Q.J.; Tan, P.K.; Yap, H.H.; Liu, B.H.; Feng, H.; Tan, H.; He, R.; Huang, Y.M.; Wang, D.D.; Zhu, L.; Chen, C.Q.; Rivai, F.; Lam, J.; Mai, Z.H. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 362 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Application of laser deprocessing technique in PFA on chemical over-etched on bond-pad issue. (September 2016) Authors: Yap, H.H.; Tan, P.K.; Zhu, L.; Feng, H.; Zhao, Y.Z.; He, R.; Tan, H.; Liu, B.; Huang, Y.M.; Wang, D.D.; Lam, J.; Mai, Z.H. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 357 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Application of laser deprocessing technique in PFA on chemical over-etched on bond-pad issue. (September 2016) Authors: Yap, H.H.; Tan, P.K.; Zhu, L.; Feng, H.; Zhao, Y.Z.; He, R.; Tan, H.; Liu, B.; Huang, Y.M.; Wang, D.D.; Lam, J.; Mai, Z.H. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 357 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Cross-sectional nanoprobing fault isolation technique on submicron devices. (September 2016) Authors: Tan, P.K.; Yap, H.H.; Chen, C.Q.; Rivai, F.; Zhao, Y.Z.; Zhu, L.; Feng, H.; Tan, H.; He, R.; Wang, D.D.; Huang, Y.M.; Ma, Y.Z.; Lam, J.; Mai, Z.H. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 321 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Cross-sectional nanoprobing fault isolation technique on submicron devices. (September 2016) Authors: Tan, P.K.; Yap, H.H.; Chen, C.Q.; Rivai, F.; Zhao, Y.Z.; Zhu, L.; Feng, H.; Tan, H.; He, R.; Wang, D.D.; Huang, Y.M.; Ma, Y.Z.; Lam, J.; Mai, Z.H. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 321 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Top-down delayering to expose large inspection area on die side-edge with Platinum (Pt) deposition technique. Issue 9 (August 2015) Authors: Yap, H.H.; Tan, P.K.; Low, G.R.; Dawood, M.K.; Feng, H.; Zhao, Y.Z.; He, R.; Tan, H.; Zhu, J.; Liu, B.; Huang, Y.M.; Wang, D.D.; Lam, J.; Mai, Z.H. Journal: Microelectronics and reliability Issue: Volume 55:Issue 9/10(2015) Page Start: 1611 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗