1. Focused ion beam preparation of halide perovskite microscopy specimens: evaluation of the beam induced damage. (12th October 2022) Authors: Lu, Yuan; Wang, Hao; Chen, Yi; Akriti, ; Hu, Xiangchen; Dou, Letian; Mi, Qixi; Ning, Zhijun; Yu, Yi Journal: Journal of physics Issue: Volume 34:Number 41(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗