1. Xe Plasma FIB-SEM with Improved Resolution of Both Ion and Electron Columns. (23rd September 2015) Authors: Jiruse, J.; Havelka, M.; Polster, J.; Hrncif, T. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1995 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Xe Plasma FIB-SEM with Improved Resolution of Both Ion and Electron Columns. (August 2015) Authors: Jiruse, J.; Havelka, M.; Polster, J.; Hrncif, T. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1995 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗