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You searched for: Author/Creator Hou, Max Ti‐KuangLimit your search
- Hou, Max Ti‐Kuang [remove] 2
- 620.5 2
- Microtechnology -- Periodicals 2
- Nanostructures -- Periodicals 2
- Nanotechnology -- Periodicals 2
- gallium compounds -- III‐V semiconductors -- wide band gap semiconductors -- light emitting diodes 1
- high‐strength nanostructured black‐silicon wafer -- photovoltaic applications -- bending strength -- trap particle contaminates -- double‐sided surface nanostructure -- morphology -- wet chemical etching -- reduce surface reflection -- conventional polished silicon wafer -- surface reflection -- thin silicon layer -- particle entrapment -- glitches -- enhancement strength -- particle testing -- protection layer 1
- nanostructured materials -- silicon -- elemental semiconductors -- bending strength -- surface morphology -- polishing -- nanofabrication -- semiconductor growth 1
- street nanotexturing -- GaN LEDs -- light‐emitting diodes -- light extraction -- n‐gallium nitride layer -- current–voltage characteristics -- current 120 mA -- GaN 1