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You searched for: Author/Creator Hou, F.C.Limit your search
- Hou, F.C. [remove] 1
- 621.381 1
- Electronics -- Periodicals 1
- random telegraph signals -- unrelaxed neutral oxygen vacancy centres -- n‐type metal‐oxide‐semiconductor field‐effect transistors -- trap capture cross‐sections -- capture activation energy -- relaxation energy -- gate oxide defects -- trap energy -- bandgap -- trap species -- electron capture -- electron switching -- SiO2 1
- vacancies (crystal) -- silicon compounds -- electron traps -- defect states -- MOSFET 1