1. An Automated Scanning Transmission Electron Microscope Guided by Sparse Data Analytics. (October 2022) Authors: Olszta, Matthew; Hopkins, Derek; Fiedler, Kevin R.; Oostrom, Marjolein; Akers, Sarah; Spurgeon, Steven R. Journal: Microscopy and microanalysis Issue: Volume 28:Number 5(2022) Page Start: 1611 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Doing More with Less: Artificial Intelligence Guided Analytics for Electron Microscopy Applications. (August 2022) Authors: Akers, Sarah; Oostrom, Marjolein; Doty, Christina; Olstza, Matthew; Hopkins, Derek; Fiedler, Kevin; Spurgeon, Steven R. Journal: Microscopy and microanalysis Issue: Volume 28(2022)Supplement 1 Page Start: 2988 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Pivot Point: The Key to TEM Automation. (August 2022) Authors: Olszta, Matthew; Fiedler, Kevin; Hopkins, Derek; Yano, Kayla; Doty, Christina; Oostrom, Marjolein; Akers, Sarah; Spurgeon, Steven R. Journal: Microscopy and microanalysis Issue: Volume 28(2022)Supplement 1 Page Start: 2920 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. The role of Nanocartography in the Development of Automated TEM. (August 2021) Authors: Olszta, Matthew; Fiedler, Kevin; Spurgeon, Steven; Reehl, Sarah; Hopkins, Derek Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 2986 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗