1. A survey of race bug detection techniques for multithreaded programmes. (19th December 2014) Authors: Hong, Shin; Kim, Moonzoo; Farchi, Eitan; Hierons, Robert M.; Lourenço, João Journal: Software testing, verification & reliability Issue: Volume 25:Number 3(2015:Jul.) Page Start: 191 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Are concurrency coverage metrics effective for testing: a comprehensive empirical investigation. (23rd June 2014) Authors: Hong, Shin; Staats, Matt; Ahn, Jaemin; Kim, Moonzoo; Rothermel, Gregg; Baudry, Benoit; Orso, Alessandro Journal: Software testing, verification & reliability Issue: Volume 25:Number 4(2015:Oct.) Page Start: 334 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. DEMINER: test generation for high test coverage through mutant exploration. (28th October 2019) Authors: Kim, Yunho; Hong, Shin Other Names: Feldt Robert guestEditor.; Yoo Shin guestEditor. Journal: Software testing, verification & reliability Issue: Volume 31:Number 1/2(2021) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Learning‐based mutant reduction using fine‐grained mutation operators. (8th August 2021) Authors: Kim, Yunho; Hong, Shin Other Names: Gopinath Rahul guestEditor.; Zhang Jie M. guestEditor.; Kintis Marinos guestEditor.; Papadakis Mike guestEditor. Journal: Software testing, verification & reliability Issue: Volume 32:Number 7(2022) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗