1. An Integrated in SEM Multi-Purpose AFM Instrument Utilizing an Active Cantilever. (August 2019) Authors: Holz, Mathias; Reum, Alexander; Ahmad, Ahmad; Ivanov, Tzvetan; Reuter, Christoph; Hofmann, Martin; Rangelow, Ivo W. Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 806 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Correlative Microscopy and Nanofabrication with AFM Integrated with SEM. (November 2019) Authors: Holz, Mathias; Reuter, Christoph; Ahmad, Ahmad; Reum, Alexander; Hofmann, Martin; Ivanov, Tzvetan; Rangelow, Ivo W. Journal: Microscopy today Issue: Volume 27:Number 6(2019) Page Start: 24 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗