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Author/Creator Heinonen, Martti

1. Atomic force microscope adhesion measurements and atomistic molecular dynamics simulations at different humidities. (23rd January 2017)

Authors:
Seppä, Jeremias; Reischl, Bernhard; Sairanen, Hannu; Korpelainen, Virpi; Husu, Hannu; Heinonen, Martti; Raiteri, Paolo; Rohl, Andrew L; Nordlund, Kai; Lassila, Antti
Journal:
Measurement science & technology
Issue:
Volume 28:Number 3(2017:Mar.)
Page Start:
Record Type:
Journal Article
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