1. Comparing lifetime and photoluminescence imaging pattern recognition methodologies for predicting solar cell results based on as‐cut wafer properties. (5th July 2012) Authors: Sinton, Ronald A.; Haunschild, Jonas; Demant, Matthias; Rein, Stefan Journal: Progress in photovoltaics Issue: Volume 21:Number 8(2013) Page Start: 1634 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Comparison of line-wise pl-imaging and area-wise pl-imaging. (September 2017) Authors: Höffler, Hannes; Dost, Georg; Brand, Andreas; Haunschild, Jonas; Schremmer, Hans; Bergmann, Andreas Journal: Energy procedia Issue: Volume 124(2017) Page Start: 66 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Grain-to-grain Contrasts in Photoluminescence Images of Silicon Wafers. (August 2015) Authors: Höffler, Hannes; Haunschild, Jonas; Rein, Stefan Journal: Energy procedia Issue: Volume 77(2015) Page Start: 83 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Inline quality rating of multi‐crystalline wafers based on photoluminescence images. (11th November 2015) Authors: Demant, Matthias; Rein, Stefan; Haunschild, Jonas; Strauch, Theresa; Höffler, Hannes; Broisch, Juliane; Wasmer, Sven; Sunder, Kirsten; Anspach, Oliver; Brox, Thomas Journal: Progress in photovoltaics Issue: Volume 24:Number 12(2016) Page Start: 1533 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Light-induced Degradation and Regeneration in n-type Silicon. (August 2015) Authors: Niewelt, Tim; Broisch, Juliane; Schön, Jonas; Haunschild, Jonas; Rein, Stefan; Warta, Wilhelm; Schubert, Martin C. Journal: Energy procedia Issue: Volume 77(2015) Page Start: 626 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Predicting bulk lifetime values by applying wet chemistry H-termination for inline quality control of silicon wafers. (September 2017) Authors: Al-Hajjawi, Saed; Haunschild, Jonas; Zimmer, Martin; Dannenberg, Tobias; Preu, Ralf Journal: Energy procedia Issue: Volume 124(2017) Page Start: 2 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗