1. 3D Atom Probe Microscopy Sample Preparation by Using L-Shape FIB-SEM-Ar Triple Beam. (August 2014) Authors: Man, Xin; Asahata, Tatsuya; Uemoto, Atsushi; Susuki, Hidekazu; Suzuki, Hiroyuki; Hasuda, Masakatsu; Fujii, Toshiaki Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 354 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. 3D Atom Probe Microscopy Sample Preparation by Using L-Shape FIB-SEM-Ar Triple Beam. (August 2014) Authors: Man, Xin; Asahata, Tatsuya; Uemoto, Atsushi; Susuki, Hidekazu; Suzuki, Hiroyuki; Hasuda, Masakatsu; Fujii, Toshiaki Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 354 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗