1. Low Leakage Single Bitline 9 T (SB9T) Static Random Access Memory. (April 2017) Authors: Ahmad, Sayeed; Gupta, Mohit Kumar; Alam, Naushad; Hasan, Mohd. Journal: Microelectronics journal Issue: Volume 62(2017) Page Start: 1 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A high-speed and scalable XOR-XNOR-based hybrid full adder design. (July 2021) Authors: Hasan, Mehedi; Hussain, Md. Shahbaz; Hossain, Mainul; Hasan, Mohd.; Zaman, Hasan U.; Islam, Sharnali Journal: Computers & electrical engineering Issue: Volume 93(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Optimization and Characterization of CMOS for Ultra Low Power Applications. (22nd December 2015) Authors: Kafeel, Mohd. Ajmal; Pable, S. D.; Hasan, Mohd.; Alam, M. Shah Other Names: Jha Niraj K. Academic Editor. Journal: Journal of nanotechnology Issue: Volume 2015(2015) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Analysis of CNT Bundle and Its Comparison with Copper Interconnect for CMOS and CNFET Drivers. (12th October 2009) Authors: Kureshi, Abdul Kadir; Hasan, Mohd. Other Names: Bansleben Donald Academic Editor. Journal: Journal of nanomaterials Issue: Volume 2009(2009) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Analysis of CNT Bundle and Its Comparison with Copper Interconnect for CMOS and CNFET Drivers. (12th October 2009) Authors: Kureshi, Abdul Kadir; Hasan, Mohd. Other Names: Bansleben Donald Academic Editor. Journal: Journal of nanomaterials Issue: Volume 2009(2009) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Analysis of CNT Bundle and Its Comparison with Copper Interconnect for CMOS and CNFET Drivers. (20th October 2009) Authors: Kureshi, Abdul Kadir; Hasan, Mohd. Other Names: Bansleben Donald Academic Editor. Journal: Journal of nanomaterials Issue: Volume 2009(2009) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Robustness Comparison of Emerging Devices for Portable Applications. (28th February 2012) Authors: Pable, S. D.; Kafeel, Mohd. Ajmal; Kureshi, A. K.; Hasan, Mohd. Other Names: Brosseau Christian Academic Editor. Journal: Journal of nanomaterials Issue: Volume 2012(2012) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗