Search

Author/Creator Hanisch, Norbert

1. A Fully Integrated Ferroelectric Thin‐Film‐Transistor – Influence of Device Scaling on Threshold Voltage Compensation in Displays. (9th May 2021)

Authors:
Lehninger, David; Ellinger, Martin; Ali, Tarek; Li, Songrui; Mertens, Konstantin; Lederer, Maximilian; Olivio, Ricardo; Kämpfe, Thomas; Hanisch, Norbert; Biedermann, Kati; Rudolph, Matthias; Brackmann, Varvara; Sanctis, Shawn; Jank, Michael P. M.; Seidel, Konrad
Journal:
Advanced Electronic Materials
Issue:
Volume 7:Number 6(2021)
Page Start:
n/a
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗

Limit your search