1. Low kV High Resolution Scanning Electron Microscopy Study of Si Nanowire Surfaces. (23rd September 2015) Authors: Alfonso, C.; Roussel, L.; Charai, A.; Dominici, C.; Campos, A. P. C.; Han, L.Y.; Zhou, F. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1261 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Low kV High Resolution Scanning Electron Microscopy Study of Si Nanowire Surfaces. (August 2015) Authors: Alfonso, C.; Roussel, L.; Charai, A.; Dominici, C.; Campos, A. P. C.; Han, L.Y.; Zhou, F. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1261 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗