1. An improved subthreshold swing expression accounting for back-gate bias in FDSOI FETs. (April 2023) Authors: Han, Hung-Chi; Jazaeri, Farzan; Zhao, Zhixing; Lehmann, Steffen; Enz, Christian Journal: Solid-state electronics Issue: Volume 202(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗