1. Heat sink implementation in back-end of line for self-heating reduction in 22 nm FDSOI MOSFETs. (October 2021) Authors: Halder, Arka; Nyssens, Lucas; Rack, Martin; Lederer, Dimitri; Raskin, Jean-Pierre; Kilchytska, Valeriya Journal: Solid-state electronics Issue: Volume 184(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗