Author/Creator: Hahm, Kai - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Hahm, Kai

1. Accurate tip characterization in critical dimension atomic force microscopy. (30th April 2020)

Authors:: Dai, Gaoliang; Xu, Linyan; Hahm, Kai
Journal:: Measurement science & technology
Issue:: Volume 31:Number 7(2020)
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Record Type:: Journal Article
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2. Comparison of line width calibration using critical dimension atomic force microscopes between PTB and NIST. (19th April 2017)

Authors:: Dai, Gaoliang; Hahm, Kai; Bosse, Harald; Dixson, Ronald G
Journal:: Measurement science & technology
Issue:: Volume 28:Number 6(2017:Jun.)
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Record Type:: Journal Article
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3. Quantitative Element‐Sensitive Analysis of Individual Nanoobjects. Issue 9 (15th December 2022)

Authors:: Wählisch, André; Unterumsberger, Rainer; Hönicke, Philipp; Lubeck, Janin; Kayser, Yves; Weser, Jan; Dai, Gaoliang; Hahm, Kai; Weimann, Thomas; Seim, Christian; Rehbein, Stefan; Beckhoff, Burkhard
Journal:: Small
Issue:: Volume 19:Issue 9(2023)
Page Start:: n/a
Record Type:: Journal Article
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