1. Microwave Frequency Comb from a Semiconductor in a Scanning Tunneling Microscope. (20th December 2016) Authors: Hagmann, Mark J.; Yarotski, Dmitry A.; Mousa, Marwan S. Editors: Thuvander, Mattias; Cairney, Julie; Gerstl, Stephan Journal: Microscopy and microanalysis Issue: Volume 23:Number 2(2017) Page Start: 443 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Simulation and Analysis of Methods for Scanning Tunneling Microscopy Feedback Control. (14th March 2019) Authors: Wiedemeier, Jeremy; Spencer, Greg; Hagmann, Mark J.; Mousa, Marwan S. Editors: Thuvander, Mattias; Meisenkothen, Frederick; Sha, Gang Journal: Microscopy and microanalysis Issue: Volume 25:Number 2(2019) Page Start: 554 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗