1. A 72% error reduction scheme based on temperature acceleration for long-term data storage applications: Cold flash and millennium memories. (July 2016) Authors: Yamazaki, Senju; Iwasaki, Tomoko Ogura; Hachiya, Shogo; Takahashi, Tomonori; Takeuchi, Ken Journal: Solid-state electronics Issue: Volume 121(2016) Page Start: 25 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A 72% error reduction scheme based on temperature acceleration for long-term data storage applications: Cold flash and millennium memories. (July 2016) Authors: Yamazaki, Senju; Iwasaki, Tomoko Ogura; Hachiya, Shogo; Takahashi, Tomonori; Takeuchi, Ken Journal: Solid-state electronics Issue: Volume 121(2016) Page Start: 25 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Carbon nanotube memory cell array program error analysis and tradeoff between reset voltage and verify pulses. (24th February 2016) Authors: Ning, Sheyang; Iwasaki, Tomoko Ogura; Hachiya, Shogo; Rosendale, Glen; Manning, Monte; Viviani, Darlene; Rueckes, Thomas; Takeuchi, Ken Journal: Japanese journal of applied physics Issue: Volume 55:Number 4(2016:Apr.)Supplement 4 Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗