1. Electrical-performance and reliability improvement of flexible low-temperature polycrystalline silicon thin-film transistors via post-annealing process. (1st October 2022) Authors: Im, Hwarim; Ahn, Jeong Hyun; Kim, Won-Young; Ha, Tae Eun; Jo, Eun Kyung; Oh, Yunjung; Cha, Myoung Geun; Choi, Sanggun; Lim, Jun Hyung; Kim, Yong-Sang Journal: Semiconductor science and technology Issue: Volume 37:Number 10(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗