1. A round robin test for total reflection X-ray fluorescence analysis using preselected and well characterized samples. Issue 9 (29th July 2021) Authors: Unterumsberger, Rainer; Beckhoff, Burkhard; Gross, Armin; Stosnach, Hagen; Nowak, Sascha; Stenzel, Yannick P.; Krämer, Markus; von Bohlen, Alex Journal: Journal of analytical atomic spectrometry Issue: Volume 36:Issue 9(2021) Page Start: 1933 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Laboratory based GIXRF and GEXRF spectrometers for multilayer structure investigations. Issue 5 (26th February 2019) Authors: Szwedowski-Rammert, Veronika; Baumann, Jonas; Schlesiger, Christopher; Waldschläger, Ulrich; Gross, Armin; Kanngießer, Birgit; Mantouvalou, Ioanna Journal: Journal of analytical atomic spectrometry Issue: Volume 34:Issue 5(2019) Page Start: 922 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗