1. Sample-in-waveguide geometry for TXRF sensitivity improvement. Issue 6 (12th May 2017) Authors: Panchuk, Vitaly; Goydenko, Alexander; Grebenyuk, Andrey; Irkaev, Sobir; Legin, Andrey; Kirsanov, Dmitry; Semenov, Valentin Journal: Journal of analytical atomic spectrometry Issue: Volume 32:Issue 6(2017) Page Start: 1224 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗