1. Insulated gate bipolar transistor reliability testing protocol for PV inverter applications. (16th January 2013) Authors: Flicker, Jack; Kaplar, Robert; Yang, Benjamin; Marinella, Matthew; Granata, Jennifer Journal: Progress in photovoltaics Issue: Volume 22:Number 9(2014) Page Start: 970 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗