1. Offline Secondary Electron Counting and Conditional Re-illumination in SEM. (August 2020) Authors: Agarwal, Akshay; Simonaitis, John; Goyal, Vivek; Berggren, Karl Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 1182 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Performance Analysis of Interaction-Free-Measurement-based Electron Microscopy. (August 2019) Authors: Agarwal, Akshay; Goyal, Vivek; Berggren, Karl K. Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 152 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Prevention Beats Removal: Avoiding Stripe Artifacts from Current Variation in Particle Beam Microscopy Through Time-Resolved Sensing. (August 2021) Authors: Watkins, Luisa; Seidel, Sheila; Peng, Minxu; Agarwal, Akshay; Yu, Christopher; Goyal, Vivek Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 422 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. The role of root development of Avena fatua in conferring soil strength. Issue 7 (1st July 2015) Authors: Dumlao, Matthew R.; Ramananarivo, Sophie; Goyal, Vivek; DeJong, Jason T.; Waller, Jack; Silk, Wendy K. Journal: American journal of botany Issue: Volume 102:Issue 7(2015) Page Start: 1050 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗