1. Analysis of p‐type SiOx layers as a boron diffusion source for n‐type c‐Si substrates. Issue 7 (16th March 2016) Authors: Goyal, Prabal; Urrejola, Elias; Hong, Junegie; Voillot, Julien; i Cabarrocas, Pere Roca; Johnson, Erik Journal: Physica status solidi Issue: Volume 213:Issue 7(2016:Jul.) Page Start: 1760 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Boron Doped SiOx Dielectrics for Bifacial n-type and p-type Silicon Solar Cells. (August 2015) Authors: Goyal, Prabal; Urrejola, Elias; Hong, Junegie; Madec, Alain Journal: Energy procedia Issue: Volume 77(2015) Page Start: 470 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Quasi‐fivefold symmetric electron diffraction patterns due to multiple twinning in silicon thin films grown from hexamethyldisiloxane. Issue 6 (1st December 2016) Authors: Haddad, Farah; Goyal, Prabal; Johnson, Erik V.; Hong, Junegie; Roca i Cabarrocas, Pere; Maurice, Jean-Luc Journal: Journal of applied crystallography Issue: Volume 49:Issue 6(2016) Page Start: 2226 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗