Author/Creator: Gottschalk, V. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Gottschalk, V.

1. Reliability evaluation of Si-dies due to assembly issues. (September 2016)

Authors:: Naumann, F.; Gottschalk, V.; Burchard, B.; Altmann, F.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 266
Record Type:: Journal Article
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2. Reliability evaluation of Si-dies due to assembly issues. (September 2016)

Authors:: Naumann, F.; Gottschalk, V.; Burchard, B.; Altmann, F.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 266
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗