Author/Creator: Godard, P. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Godard, P.

1. In situ x-ray diffraction analysis of 2D crack patterning in thin films. (15th February 2019)

Authors:: Faurie, D.; Zighem, F.; Godard, P.; Parry, G.; Sadat, T.; Thiaudière, D.; Renault, P.-O.
Journal:: Acta materialia
Issue:: Volume 165(2019)
Page Start:: 177
Record Type:: Journal Article
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2. Strain ratio and thickness effects on plasticity and crack patterns of Nickel thin films. (May 2022)

Authors:: Godard, P.; Guillot, A.; Zighem, F.; Thiaudière, D.; Faurie, D.; Renault, P.O.
Journal:: Scripta materialia
Issue:: Number 213(2022)
Page Start:
Record Type:: Journal Article
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3. X-ray diffraction and stress relaxations to study thermal and stress-assisted annealings in nanocrystalline gold thin films. (July 2019)

Authors:: Godard, P.; Faurie, D.; Sadat, T.; Drouet, M.; Thiaudière, D.; Renault, P.O.
Journal:: Acta materialia
Issue:: Volume 173(2019)
Page Start:: 87
Record Type:: Journal Article
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