1. Application of VR/AR technology for visualisation of radiation tolerance of VLSI. (9th April 2020) Authors: Shakhnov, V.A.; Kazakov, V.V.; Glushko, A.A.; Rezchikova, E.V.; Sorokin, B.S.; Tsivinskaya, T.A.; Verstov, V.A.; Zinchenko, L.A. Journal: International journal of nanotechnology Issue: Volume 16:Number 6/10(2019) Page Start: 569 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗