Author/Creator: Gluch, J. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Gluch, J.

1. 30 nm X-ray focusing correlates oscillatory stress, texture and structural defect gradients across multilayered TiN-SiOx thin film. (1st February 2018)

Authors:: Keckes, J.; Daniel, R.; Todt, J.; Zalesak, J.; Sartory, B.; Braun, S.; Gluch, J.; Rosenthal, M.; Burghammer, M.; Mitterer, C.; Niese, S.; Kubec, A.
Journal:: Acta materialia
Issue:: Volume 144(2018)
Page Start:: 862
Record Type:: Journal Article
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2. Sub 25 nm focusing with a long working distance using multilayer Laue lenses. (9th April 2018)

Authors:: Kubec, A.; Niese, S.; Rosenthal, M.; Gluch, J.; Burghammer, M.; Gawlitza, P.; Keckes, J.; Leson, A.
Journal:: Journal of instrumentation
Issue:: Volume 13:Number 4(2018:Apr.)
Page Start:: C04011
Record Type:: Journal Article
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