1. Transmission line pulse (TLP) as integrative method for the investigation of ultra-fast trapping mechanisms on high-k MIM. (September 2019) Authors: Merlo, L.; Rossetto, I.; Cerati, L.; Ghidini, G.; Milani, A.; Toia, F.; Piagge, R.; Di Biccari, L.; Gevinti, E.; Croce, G.; Andreini, A. Journal: Microelectronics and reliability Issue: Volume 100/101(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗