1. Robustness of single-electron pumps at sub-ppm current accuracy level. (20th December 2016) Authors: Stein, F; Scherer, H; Gerster, T; Behr, R; Götz, M; Pesel, E; Leicht, C; Ubbelohde, N; Weimann, T; Pierz, K; Schumacher, H W; Hohls, F Journal: Metrologia Issue: Volume 54:Number 1(2017:Feb.) Page Start: S1 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗