1. Circuit Editing and Failure Analysis Applications using a Three-Ion-Beam (Ga, He and Ne) System and Gas Injection System (GIS). (23rd September 2015) Authors: Xia, Deying; Wu, Huimeng; Geotze, Bernhard; Ferranti, David; Stern, Lewis; Notte, John Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1165 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Circuit Editing and Failure Analysis Applications using a Three-Ion-Beam (Ga, He and Ne) System and Gas Injection System (GIS). (August 2015) Authors: Xia, Deying; Wu, Huimeng; Geotze, Bernhard; Ferranti, David; Stern, Lewis; Notte, John Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1165 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗