Author/Creator: Genzel, Ch. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Genzel, Ch.

1. A novel approach for nondestructive depth-resolved analysis of residual stress and grain interaction in the near-surface zone applied to an austenitic stainless steel sample subjected to mechanical polishing. (15th May 2022)

Authors:: Marciszko-Wiąckowska, M.; Oponowicz, A.; Baczmański, A.; Braham, Ch.; Wątroba, M.; Wróbel, M.; Klaus, M.; Genzel, Ch.
Journal:: Measurement
Issue:: Volume 194(2022)
Page Start:
Record Type:: Journal Article
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2. Diffraction analysis of strongly inhomogeneous residual stress depth distributions by modification of the stress scanning method. I. Theoretical concept. (1st October 2015)

Authors:: Meixner, M.; Fuss, T.; Klaus, M.; Genzel, Ch.
Journal:: Journal of applied crystallography
Issue:: Volume 48:Part 5(2015:Oct.)
Page Start:: 1451
Record Type:: Journal Article
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3. Residual stress analysis of diamond‐coated WC–Co cutting tools: separation of film and substrate information by grazing X‐ray diffraction. (25th September 2013)

Authors:: Meixner, M.; Klaus, M.; Genzel, Ch.; Reimers, W.
Journal:: Journal of applied crystallography
Issue:: Volume 46:Part 5(2013:Oct.)
Page Start:: 1323
Record Type:: Journal Article
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4. Sin2ψ‐based residual stress gradient analysis by energy‐dispersive synchrotron diffraction constrained by small gauge volumes. I. Theoretical concept. (15th May 2013)

Authors:: Meixner, M.; Klaus, M.; Genzel, Ch.
Journal:: Journal of applied crystallography
Issue:: Volume 46:Part 3(2013:Jun.)
Page Start:: 610
Record Type:: Journal Article
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5. Sin2ψ‐based residual stress gradient analysis by energy‐dispersive synchrotron diffraction constrained by small gauge volumes. II. Experimental implementation. (15th May 2013)

Authors:: Meixner, M.; Klaus, M.; Genzel, Ch.
Journal:: Journal of applied crystallography
Issue:: Volume 46:Part 3(2013:Jun.)
Page Start:: 619
Record Type:: Journal Article
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6. White‐beam X‐ray radioscopy and tomography with simultaneous diffraction at the EDDI beamline. (24th July 2013)

Authors:: García‐Moreno, F.; Jiménez, C.; Kamm, P. H.; Klaus, M.; Wagener, G.; Banhart, J.; Genzel, Ch.
Journal:: Journal of synchrotron radiation
Issue:: Volume 20:Part 5(2013)
Page Start:: 809
Record Type:: Journal Article
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