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Author/Creator Geiger, Michael

1. Effect of the Degree of the Gate‐Dielectric Surface Roughness on the Performance of Bottom‐Gate Organic Thin‐Film Transistors. Issue 10 (29th March 2020)

Authors:
Geiger, Michael; Acharya, Rachana; Reutter, Eric; Ferschke, Thomas; Zschieschang, Ute; Weis, Jürgen; Pflaum, Jens; Klauk, Hagen; Weitz, Ralf Thomas
Journal:
Advanced materials interfaces
Issue:
Volume 7:Issue 10(2020)
Page Start:
n/a
Record Type:
Journal Article
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6. Structural Insights Into PfARO and Characterization of its Interaction With PfAIP. Issue 4 (14th February 2020)

Authors:
Geiger, Michael; Brown, Chris; Wichers, Jan Stephan; Strauss, Jan; Lill, Andrés; Thuenauer, Roland; Liffner, Benjamin; Wilcke, Louisa; Lemcke, Sarah; Heincke, Dorothee; Pazicky, Samuel; Bachmann, Anna; Löw, Christian; Wilson, Danny William; Filarsky, Michael; Burda, Paul-Christian; Zhang, Kun; Ju...
Journal:
Journal of molecular biology
Issue:
Volume 432:Issue 4(2020)
Page Start:
878
Record Type:
Journal Article
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7. Subthreshold Swing of 59 mV decade−1 in Nanoscale Flexible Ultralow‐Voltage Organic Transistors. (5th January 2022)

Authors:
Geiger, Michael; Lingstädt, Robin; Wollandt, Tobias; Deuschle, Julia; Zschieschang, Ute; Letzkus, Florian; Burghartz, Joachim N.; van Aken, Peter A.; Weitz, R. Thomas; Klauk, Hagen
Journal:
Advanced Electronic Materials
Issue:
Volume 8:Number 5(2022)
Page Start:
n/a
Record Type:
Journal Article
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