Author/Creator: Gebhart, David D. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Gebhart, David D.

1. Linking through-thickness cracks in metallic thin films to in-situ electrical resistance peak broadening. (15th April 2022)

Authors:: Gebhart, David D.; Krapf, Anna; Gammer, Christoph; Merle, Benoit; Cordill, Megan J.
Journal:: Scripta materialia
Issue:: Number 212(2022)
Page Start:
Record Type:: Journal Article
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