1. Channel-Length Dependent Performance Degradation of Thermally Stressed IGZO TFTs. (23rd July 2018) Authors: Kabir, Muhammad Salahuddin; Ganesh, Prashant; Chowdhury, Rahnuma Rifat; Sethupathi, Harithshanmaa; Okvath, Julia; Konowitch, Jason; Manley, Robert G.; Hirschman, Karl D Journal: ECS transactions Issue: Volume 86:Number 11(2018) Page Start: 125 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Investigation on Alumina Passivation for Improved IGZO TFT Performance. (25th April 2016) Authors: Mudgal, Tarun; Edwards, Nicholas; Ganesh, Prashant; Bharadwaj, Anish; Manley, Robert G.; Hirschman, Karl D Journal: ECS transactions Issue: Volume 72:Number 5(2016) Page Start: 67 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Investigation on the Gate Electrode Configuration of IGZO TFTs for Improved Channel Control and Suppression of Bias-Stress Induced Instability. (18th August 2016) Authors: Mudgal, Tarun; Edwards, Nicholas; Ganesh, Prashant; Bharadwaj, Anish; Powell, Eli; Pierce, Michael S; Manley, Robert G.; Hirschman, Karl D Journal: ECS transactions Issue: Volume 75:Number 10(2016) Page Start: 189 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗